Feedback-controlled electromigration

Feedback-controlled electromigration (FCE) is an experimental technique to investigate the phenomenon known as electromigration. By controlling the voltage applied as the conductance varies it is possible to keep the voltage at a critical level for electromigration.

Theory

FCE has been shown to be reversible, demonstrating the fact that the electrons are moving rather than thermomigration or sublimation. The migration occurs due to the electronic wind force experienced by the metallic adatom.[1] The electromigration occurs at a critical power dissipation in the neck of the bridge.[2] This leads to Electromigrated Nanogaps which hold immense potential for sensing applications, exploiting the quantum tunneling effect.[3][4]

Uses

FCE is often used in forming nanogaps in metallic bridges.

Problems

Thermal runaway can occur when the neck is narrower than about 20 nm.[5]

  1. ^ H.Ishida (September 2000). "Driving force for adatom electromigration within mixed Cu/Al overlayers on Al(111)". Journal of Applied Physics. 89 (9): 4809–4814. Bibcode:2001JAP....89.4809R. doi:10.1063/1.1325385.
  2. ^ D.R. Strachan; et al. (2006). "Clean Electromigrated Nanogaps Imaged by Transmission Electron Microscopy". Nano Letters. 6 (3): 441–444. Bibcode:2006NanoL...6..441S. doi:10.1021/nl052302a. PMID 16522038.
  3. ^ Raja, Shyamprasad N.; Jain, Saumey; Kipen, Javier; Jaldén, Joakim; Stemme, Göran; Herland, Anna; Niklaus, Frank (17 July 2024). "Electromigrated Gold Nanogap Tunnel Junction Arrays: Fabrication and Electrical Behavior in Liquid and Gaseous Media". ACS Applied Materials & Interfaces. 16 (28): 37131–37146. doi:10.1021/acsami.4c03282. ISSN 1944-8244. PMC 11261569. PMID 38954436.
  4. ^ Raja, Shyamprasad N.; Jain, Saumey; Kipen, Javier; Jaldén, Joakim; Stemme, Göran; Herland, Anna; Niklaus, Frank (1 July 2024). "High-bandwidth low-current measurement system for automated and scalable probing of tunnel junctions in liquids". Review of Scientific Instruments. 95 (7). Bibcode:2024RScI...95g4710R. doi:10.1063/5.0204188. ISSN 0034-6748. PMID 39037302.
  5. ^ M.Mahadevan and R.m. Bradley (1999). "Simulations and theory of electromigration-induced slit formation in unpassivated single-crystal metal lines". Physical Review B. 59 (16): 11037–11046. Bibcode:1999PhRvB..5911037M. doi:10.1103/PhysRevB.59.11037.

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